HL

Hua-Yu Liu

NT Numerical Technologies: 11 patents #3 of 41Top 8%
AB Asml Netherlands B.V.: 10 patents #458 of 3,192Top 15%
SY Synopsys: 4 patents #328 of 2,302Top 15%
DC Dongfang Jingyuan Electron Co.: 2 patents #5 of 13Top 40%
HP HP: 2 patents #2,312 of 7,018Top 35%
Overall (All Time): #118,546 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 25 most recent of 31 patents

Patent #TitleCo-InventorsDate
10565702 Dynamic updates for the inspection of integrated circuits Zhaoli Zhang, Jie Lin, Zongchang Yu 2020-02-18
10423745 Correction for flare effects in lithography system Jiangwei Li, Luoqi Chen, Wei-Cheng Liu, Jiong Jiang 2019-09-24
10133838 Guided defect detection of integrated circuits Jie Lin, Zhaoli Zhang, Zongchang Yu 2018-11-20
9940427 Lens heating aware source mask optimization for advanced lithography Michael M. Crouse, Youri Johannes Laurentius Maria Van Dommelen, Peng Liu, Aiqin JIANG, Wenjin Huang 2018-04-10
9934350 Pattern selection for full-chip source and mask optimization 2018-04-03
9183324 Pattern selection for full-chip source and mask optimization 2015-11-10
8887104 Correction for flare effects in lithography system Jiangwei Li, Luoqi Chen, Wei-Cheng Liu, Jiong Jiang 2014-11-11
8739082 Method of pattern selection for source and mask optimization Luoqi Chen, Hong Chen, Zhi-Pan Li, Jun Ye, Min-Chun Tsai +3 more 2014-05-27
8543947 Selection of optimum patterns in a design layout based on diffraction signature analysis Luoqi Chen, Hong Chen, Zhi-Pan Li 2013-09-24
D689039 Stereo set 2013-09-03
8438508 Pattern selection for full-chip source and mask optimization 2013-05-07
8245160 System and method for creating a focus-exposure model of a lithography process Jun Ye, Yu Cao, Luoqi Chen 2012-08-14
8065636 System and method for creating a focus-exposure model of a lithography process Jun Ye, Yu Cao, Luoqi Chen 2011-11-22
7747978 System and method for creating a focus-exposure model of a lithography process Jun Ye, Yu Cao, Luoqi Chen 2010-06-29
7251377 Cell library that can automatically avoid forbidden pitches 2007-07-31
7178128 Alternating phase shift mask design conflict resolution Christophe Pierrat, Kent Richardson 2007-02-13
7082596 Simulation-based selection of evaluation points for model-based optical proximity correction 2006-07-25
6944844 System and method to determine impact of line end shortening 2005-09-13
6859918 Alleviating line end shortening by extending phase shifters Melody W. Ma 2005-02-22
6830854 System and method for correcting 3D effects in an alternating phase-shifting mask Yong Liu 2004-12-14
6813759 Hybrid optical proximity correction for alternating aperture phase shifting designs Weinong Lai, Xiaoyang Li 2004-11-02
6704921 Automated flow in PSM phase assignment 2004-03-09
6684382 Microloading effect correction 2004-01-27
6670082 System and method for correcting 3D effects in an alternating phase-shifting mask Yong Liu 2003-12-30
6664009 Method and apparatus for allowing phase conflicts in phase shifting mask and chromeless phase edges 2003-12-16