Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE +5 more | 2025-08-12 |
| 10635004 | Correction using stack difference | Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Hans Van Der Laan, Bart Visser, Martin Jacobus Johan Jak | 2020-04-28 |
| 9940427 | Lens heating aware source mask optimization for advanced lithography | Michael M. Crouse, Youri Johannes Laurentius Maria Van Dommelen, Peng Liu, Hua-Yu Liu, Wenjin Huang | 2018-04-10 |