YC

Yu Cao

AB Asml Netherlands B.V.: 80 patents #28 of 3,192Top 1%
Huawei: 65 patents #152 of 15,535Top 1%
BU Baidu Usa: 16 patents #30 of 423Top 8%
BT Brion Technologies: 9 patents #3 of 19Top 20%
PL Platformation: 5 patents #1 of 2Top 50%
General Motors: 5 patents #3,082 of 18,328Top 20%
KL Kla-Tencor: 4 patents #809 of 1,394Top 60%
ON Onetta: 3 patents #10 of 21Top 50%
Futurewei Technologies: 2 patents #668 of 1,563Top 45%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
WU Wenzhou University: 1 patents #55 of 159Top 35%
CO Comcast: 1 patents #2,409 of 4,447Top 55%
BC Baidu.Com Times Technology (Beijing) Co.: 1 patents #91 of 153Top 60%
IBM: 1 patents #44,794 of 70,183Top 65%
Meta: 1 patents #4,098 of 6,845Top 60%
CU Central China Normal University: 1 patents #24 of 69Top 35%
HP HP: 1 patents #8,774 of 16,619Top 55%
BT Beijing University Of Posts And Telecommunications: 1 patents #123 of 333Top 40%
📍 Sunnyvale, CA: #14 of 14,302 inventorsTop 1%
🗺 California: #489 of 386,348 inventorsTop 1%
Overall (All Time): #2,955 of 4,157,543Top 1%
211
Patents All Time

Issued Patents All Time

Showing 201–211 of 211 patents

Patent #TitleCo-InventorsDate
7117477 System and method for lithography simulation Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen 2006-10-03
7117478 System and method for lithography simulation Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen 2006-10-03
7114145 System and method for lithography simulation Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen 2006-09-26
7111277 System and method for lithography simulation Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen 2006-09-19
7003758 System and method for lithography simulation Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen 2006-02-21
6782199 Optical communications systems with optical subsystem communications links Jun Ye, Yen-Wen Lu 2004-08-24
6654489 Apparatus and methods for collecting global data during a reticle inspection James Wiley, Jun Ye, Shauh-Teh Juang, David Alles, Yen-Wen Lu 2003-11-25
6567960 System for improving circuit simulations by utilizing a simplified circuit model based on effective capacitance and inductance values Norman Chang, Osamu Nakagawa, Shen Lin, Weize Xie 2003-05-20
6516085 Apparatus and methods for collecting global data during a reticle inspection James Wiley, Jun Ye, Shauh-Teh Juang, David Alles, Yen-Wen Lu 2003-02-04
6476961 Optical amplifier systems with transient control Jun Ye, Yen-Wen Lu 2002-11-05
6414788 Optical amplifier system with transient control Jun Ye, Yen-Wen Lu 2002-07-02