GH

Gilbert Hausmann

Applied Materials: 14 patents #962 of 7,310Top 15%
CL Covidien Lp: 3 patents #1,182 of 2,878Top 45%
NB Nellcor Puritan Bennett: 2 patents #103 of 287Top 40%
Overall (All Time): #237,027 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10532170 Method and system for classification of photo-plethysmographically detected respiratory effort Clark R. Baker, Jr., Michael P. O'Neil, Shannon E. Campbell 2020-01-14
9044558 Method and system for classification of photo-plethysmographically detected respiratory effort Clark R. Baker, Jr., Michael P. O'Neil, Shannon E. Campbell 2015-06-02
8365730 Method and system for classification of photo-plethysmographically detected respiratory effort Clark R. Baker, Jr., Michael P. O'Neil, Shannon E. Campbell 2013-02-05
8219170 System and method for practicing spectrophotometry using light emitting nanostructure devices Michael P. O'Neil, Paul D. Mannheimer 2012-07-10
7984714 Managing obstructive sleep apnea and/or snoring using local time released agents Shannon E. Campbell 2011-07-26
6908865 Method and apparatus for cleaning substrates Martin Kranz, Srinivas Guggilla, Suraj Rengarajan, Mei Chang, Gongda Yao +1 more 2005-06-21
6743473 Chemical vapor deposition of barriers from novel precursors Vijay D. Parkhe, Jagadish Kalyanam 2004-06-01
6547934 Reduction of metal oxide in a dual frequency etch chamber Barney M. Cohen, Vijay D. Parkhe, Zheng Xu 2003-04-15
6475902 Chemical vapor deposition of niobium barriers for copper metallization Vijay D. Parkhe, Jagadish Kalyanam 2002-11-05
6219219 Cathode assembly containing an electrostatic chuck for retaining a wafer in a semiconductor wafer processing system Anantha K. Subramani, Peter Satitpunwaycha, Raymond Gristi, Bradley O. Stimson, Chia-Au Bill Lu +2 more 2001-04-17
6215640 Apparatus and method for actively controlling surface potential of an electrostatic chuck 2001-04-10
6163448 Apparatus and method for ex-situ testing of performance parameters on an electrostatic chuck 2000-12-19
6117246 Conductive polymer pad for supporting a workpiece upon a workpiece support surface of an electrostatic chuck Vijay D. Parkhe 2000-09-12
6104596 Apparatus for retaining a subtrate in a semiconductor wafer processing system and a method of fabricating same 2000-08-15
6099697 Method of and apparatus for restoring a support surface in a semiconductor wafer processing system 2000-08-08
6067222 Substrate support apparatus and method for fabricating same 2000-05-23
6057244 Method for improved sputter etch processing Vijay D. Parkhe, Chia-Ao William LU, Michael S. Jackson 2000-05-02
5886866 Electrostatic chuck having a combination electrode structure for substrate chucking, heating and biasing 1999-03-23
5880923 Method and apparatus for improved retention of a semiconductor wafer within a semiconductor wafer processing system 1999-03-09