Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11846738 | Radiation detection systems and methods | Mark Clopton, Clayton Fullwood | 2023-12-19 |
| 8440357 | Fuel cell catalyst regeneration | Daniel E. Posey | 2013-05-14 |
| 7981825 | Fuel cell catalyst regeneration | Daniel E. Posey | 2011-07-19 |
| 7645993 | Arrayed neutron detector with multi shielding allowing for discrimination between radiation types | Jerzy Gazda | 2010-01-12 |
| 6579788 | Method of forming conductive interconnections on an integrated circuit device | Clive Jones, Amiya R. Ghatak-Roy | 2003-06-17 |
| 6515367 | Sub-cap and method of manufacture therefor in integrated circuit capping layers | Joffre F. Bernard, Minh Van Ngo | 2003-02-04 |
| 6434217 | System and method for analyzing layers using x-ray transmission | Bruce Lynn Pickelsimer | 2002-08-13 |
| 6406996 | Sub-cap and method of manufacture therefor in integrated circuit capping layers | Joffre F. Bernard, Minh Van Ngo | 2002-06-18 |
| 6376267 | Scattered incident X-ray photons for measuring surface roughness of a semiconductor topography | Brooke M. Noack | 2002-04-23 |
| 6271112 | Interlayer between titanium nitride and high density plasma oxide | Christopher Wooten, Craig W. Christian, Thomas E. Spikes, Jr., Allen L. Evans | 2001-08-07 |
| 6242785 | Nitride based sidewall spaces for submicron MOSFETs | Amiya R. Ghatak-Roy, Clive Jones | 2001-06-05 |
| 6191032 | Thin titanium film as self-regulating filter for silicon migration into aluminum metal lines | Don A. Tiffin, William S. Brennan, David Soza, Patrick L. Smith, Allen W. White | 2001-02-20 |
| 6173036 | Depth profile metrology using grazing incidence X-ray fluorescence | Don A. Tiffin, Cornelia Weiss | 2001-01-09 |
| 6156650 | Method of releasing gas trapped during deposition | William S. Brennan, Berta Valdez, Renee S. Prusik, Amiya R. Ghatak-Roy | 2000-12-05 |
| 6151119 | Apparatus and method for determining depth profile characteristics of a dopant material in a semiconductor device | Alan Campion, Charles E. May | 2000-11-21 |
| 6144103 | Graded PB for C4 bump technology | Roy Mark Miller, Bernd Maile, Don A. Tiffin | 2000-11-07 |
| 6097079 | Boron implanted dielectric structure | Franklin D. Crawford, Jr., Don A. Tiffin | 2000-08-01 |
| 6075261 | Neutron detecting semiconductor device | Franklin D. Crawford, Jr., Don A. Tiffin | 2000-06-13 |
| 6067154 | Method and apparatus for the molecular identification of defects in semiconductor manufacturing using a radiation scattering technique such as raman spectroscopy | Charles E. May | 2000-05-23 |
| 6043486 | Absolute standard reference materials for low-level concentration measurements | — | 2000-03-28 |
| 6005915 | Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons | Donald A. Tiffin, Joel R. Stanford | 1999-12-21 |
| 5965945 | Graded PB for C4 pump technology | Roy Mark Miller, Bernd Maile, Don A. Tiffin | 1999-10-12 |
| 5913131 | Alternative process for BPTEOS/BPSG layer formation | Franklin D. Crawford, Jr., Don A. Tiffin | 1999-06-15 |
| 5866899 | Concentration measurement apparatus calibration method | — | 1999-02-02 |
| 5841016 | Ultra-low level standard for concentration measurements | John K. Lowell | 1998-11-24 |