Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6211685 | Surface probe for determining physical properties of a semiconductor device | Jeffrey Kersten | 2001-04-03 |
| 6005915 | Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons | Tim Z. Hossain, Donald A. Tiffin | 1999-12-21 |