Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6005915 | Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons | Tim Z. Hossain, Joel R. Stanford | 1999-12-21 |
| 5754620 | Apparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor wafer | Tim Z. Hossain | 1998-05-19 |
| 5742658 | Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer | Tim Z. Hossain | 1998-04-21 |
| 5520769 | Method for measuring concentration of dopant within a semiconductor substrate | Michael Barrett, Chih-Kang Shih, Ying Li, Michael J. Dennis | 1996-05-28 |