Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5520769 | Method for measuring concentration of dopant within a semiconductor substrate | Michael Barrett, Chih-Kang Shih, Donald A. Tiffin, Ying Li | 1996-05-28 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5520769 | Method for measuring concentration of dopant within a semiconductor substrate | Michael Barrett, Chih-Kang Shih, Donald A. Tiffin, Ying Li | 1996-05-28 |