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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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John K. Lowell — 11 Patents

AMD: 11 patents #1,121 of 9,280Top 15%
Round Rock, TX: #339 of 1,915 inventorsTop 20%
Texas: #13,915 of 125,132 inventorsTop 15%
Overall (All Time): #435,149 of 4,157,543Top 15%
11 Patents All Time
John K. Lowell has been granted 11 US patents while listed as an inventor at AMD. The first was granted in 1995 and the most recent in February 2001. John K. Lowell ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list John K. Lowell in Round Rock, TX, US.

Patents per Year

Patents granted per year, 1995 to 2001Bar chart with a peak of 3 patents in 1998.peak 31995: 1 patents19951996: 2 patents19961997: 1 patents19971998: 3 patents19981999: 3 patents19992001: 1 patents2001

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
6190518 Device for reducing plasma etch damage and method for manufacturing same Tony Phan, Tom J. Goodwin 2001-02-20 $7,201,000
5963783 In-line detection and assessment of net charge in PECVD silicon dioxide (oxide) layers Fred N. Hause, Robert Dawson 1999-10-05 $1,787,000
5907764 In-line detection and assessment of net charge in PECVD silicon dioxide (oxide) layers Fred N. Hause, Robert Dawson 1999-05-25 $7,746,000
5891743 Method of forming buried oxygen layer using MeV ion implantation 1999-04-06 $2,671,000
5841016 Ultra-low level standard for concentration measurements Tim Z. Hossain 1998-11-24 $5,156,000
5804981 Method of detecting heavy metal impurities introduced into a silicon wafer during ion implantation Norman L. Armour, Julia Sherry 1998-09-08 $2,062,000
5778039 Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF) Tim Z. Hossain 1998-07-07 $3,620,000
5657363 Method and apparatus for determining the thickness and elemental composition of a thin film using radioisotopic X-ray fluorescence (RXRF) Tim Z. Hossain 1997-08-12 $11,591,000
5581194 Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage 1996-12-03 $4,546,000
5557409 Characterization of an external silicon interface using optical second harmonic generation Michael W. Downer, Jerry Dadap 1996-09-17 $3,034,000
5471293 Method and device for determining defects within a crystallographic substrate Mohammed Anjum, Valerie A. Wenner, Norman L. Armour, Maung H. Kyaw 1995-11-28 $4,822,000