Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5804981 | Method of detecting heavy metal impurities introduced into a silicon wafer during ion implantation | John K. Lowell, Julia Sherry | 1998-09-08 |
| 5471293 | Method and device for determining defects within a crystallographic substrate | John K. Lowell, Mohammed Anjum, Valerie A. Wenner, Maung H. Kyaw | 1995-11-28 |