Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5804981 | Method of detecting heavy metal impurities introduced into a silicon wafer during ion implantation | John K. Lowell, Norman L. Armour | 1998-09-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5804981 | Method of detecting heavy metal impurities introduced into a silicon wafer during ion implantation | John K. Lowell, Norman L. Armour | 1998-09-08 |