Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 5804981 | Method of detecting heavy metal impurities introduced into a silicon wafer during ion implantation | John K. Lowell, Norman L. Armour | 1998-09-08 | $2,062,000 |