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Valerie A. Wenner

AM AMD: 1 patents #5,683 of 9,279Top 65%
🗺 Texas: #73,555 of 125,132 inventorsTop 60%
Overall (All Time): #3,785,443 of 4,157,543Top 95%
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Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5471293 Method and device for determining defects within a crystallographic substrate John K. Lowell, Mohammed Anjum, Norman L. Armour, Maung H. Kyaw 1995-11-28