Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10928329 | Method and system for optically detecting and characterizing defects in semiconductors | Farbod Shafiei | 2021-02-23 |
| 6411388 | System and method for frequency domain interferometric second harmonic spectroscopy | Philip T. Wilson | 2002-06-25 |
| 5557409 | Characterization of an external silicon interface using optical second harmonic generation | Jerry Dadap, John K. Lowell | 1996-09-17 |