Eckhard Langer — 10 Patents at AMD

Eckhard Langer has been granted 10 US patents while listed as an inventor at AMD. The first was granted in 2004 and the most recent in November 2013. Eckhard Langer ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Eckhard Langer in Dresden, DE.

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8575029	Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance	Moritz Andreas Meyer, Matthias Lehr	2013-11-05	$2,151,000
8329577	Method of forming an alloy in an interconnect structure to increase electromigration resistance	Matthias Lehr, Moritz Andreas Meyer	2012-12-11	$1,376,000
8118932	Technique for monitoring dynamic processes in metal lines of microstructures	Joerg Buschbeck, Marco Grafe	2012-02-21	$8,175,000
8058081	Method of testing an integrity of a material layer in a semiconductor structure	Moritz Andreas Meyer, Frank Koschinsky	2011-11-15	$6,438,000
8058731	Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance	Moritz Andreas Meyer, Matthias Lehr	2011-11-15	$6,438,000
7611991	Technique for increasing adhesion of metallization layers by providing dummy vias	Ralf Richter, Matthias Schaller, Ellen Claus	2009-11-03	$7,148,000
7335880	Technique for CD measurement on the basis of area fraction determination	Moritz Andreas Meyer	2008-02-26	$8,371,000
7311008	Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure	Ehrenfried Zschech	2007-12-25
6953755	Technique for monitoring the state of metal lines in microstructures	Moritz Andreas Meyer, Ehrenfried Zschech	2005-10-11	$12,751,000
6716650	Interface void monitoring in a damascene process	Frank Koschinsky, Volker Kahlert, Peter Hübler	2004-04-06	$3,021,000

Eckhard Langer — 10 Patents

Issued Patents All Time

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