Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Moritz Andreas Meyer — 11 Patents

AMD: 6 patents #2,041 of 9,280Top 25%
Globalfoundries: 4 patents #817 of 4,424Top 20%
Pulheim, DE: #21 of 276 inventorsTop 8%
Overall (All Time): #435,149 of 4,157,543Top 15%
11 Patents All Time
Moritz Andreas Meyer has been granted 11 US patents while listed as an inventor at AMD. The first was granted in 2005 and the most recent in June 2025. Moritz Andreas Meyer ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Moritz Andreas Meyer in Pulheim, DE.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12319900 Integral gas-introduction and stirring unit for gas-liquid reactors Patrick BONGARTZ, Matthias Wessling 2025-06-03
9898572 Metal line layout based on line shifting Thomas Melde, Matthias Lehr, Thomas Herrmann, Jens Hassmann, Rakesh Kumar Kuncha 2018-02-20 $9,359,000
9281252 Method comprising applying an external mechanical stress to a semiconductor structure and semiconductor processing tool Alexander Würfel 2016-03-08 $1,276,000
8575029 Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance Matthias Lehr, Eckhard Langer 2013-11-05 $2,151,000
8329577 Method of forming an alloy in an interconnect structure to increase electromigration resistance Matthias Lehr, Eckhard Langer 2012-12-11 $1,376,000
8058731 Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance Matthias Lehr, Eckhard Langer 2011-11-15 $6,438,000
8058081 Method of testing an integrity of a material layer in a semiconductor structure Eckhard Langer, Frank Koschinsky 2011-11-15 $6,438,000
8039395 Technique for forming embedded metal lines having increased resistance against stress-induced material transport Hans-Juergen Engelmann, Ehrenfried Zschech, Peter Huebler 2011-10-18 $1,986,000
7718447 System and method for estimating the crystallinity of stacked metal lines in microstructures Inka Zienert, Hartmut Prinz 2010-05-18 $8,134,000
7335880 Technique for CD measurement on the basis of area fraction determination Eckhard Langer 2008-02-26 $8,371,000
6953755 Technique for monitoring the state of metal lines in microstructures Ehrenfried Zschech, Eckhard Langer 2005-10-11 $12,751,000