Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8039395 | Technique for forming embedded metal lines having increased resistance against stress-induced material transport | Moritz Andreas Meyer, Ehrenfried Zschech, Peter Huebler | 2011-10-18 |
| 7183629 | Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal line | Ehrenfried Zschech, Peter Huebler | 2007-02-27 |
| 6303399 | Method of sample preparation for electron microscopy | Beate Volkmann, Ehrenfried Zschech | 2001-10-16 |