Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11243151 | Device for carrying out bending tests on panel-shaped or beam shaped samples | Christoph Sander, Martin Gall, Frank Macher, Andre Clausner | 2022-02-08 |
| 10151645 | Arrangement and method for the synchronous determination of the shear modulus and of the Poisson's number on samples of elastically isotropic and anisotropic materials | Kong Boon Yeap, Malgorzata Kopycinska-Mueller, Martin Gall | 2018-12-11 |
| 10153062 | Illumination and imaging device for high-resolution X-ray microscopy with high photon energy | Martin Gall, Reiner Dietsch, Sven Niese | 2018-12-11 |
| 9117771 | Insulation material for integrated circuits and use of said integrated circuits | Gotthart Seifert, Helmut Hermann, Konstyantyn Zagorodniy | 2015-08-25 |
| 8056402 | Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques | Michael Hecker, Piotr Grabiec, Pawel Janus, Teodor Gotszalk | 2011-11-15 |
| 8039395 | Technique for forming embedded metal lines having increased resistance against stress-induced material transport | Moritz Andreas Meyer, Hans-Juergen Engelmann, Peter Huebler | 2011-10-18 |
| 7441446 | Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing | Dmytro Chumakov, Holm Geisler | 2008-10-28 |
| 7311008 | Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure | Eckhard Langer | 2007-12-25 |
| 7183629 | Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal line | Hans-Juergen Engelmann, Peter Huebler | 2007-02-27 |
| 6953755 | Technique for monitoring the state of metal lines in microstructures | Moritz Andreas Meyer, Eckhard Langer | 2005-10-11 |
| 6894390 | Soft error resistant semiconductor device | Gisela Schammler, Mathias Bottcher, Frank Kuechenmeister, Daniel Gehre | 2005-05-17 |
| 6303399 | Method of sample preparation for electron microscopy | Hans-Juergen Engelmann, Beate Volkmann | 2001-10-16 |