| 11243151 |
Device for carrying out bending tests on panel-shaped or beam shaped samples |
Christoph Sander, Martin Gall, Frank Macher, Andre Clausner |
2022-02-08 |
| 10151645 |
Arrangement and method for the synchronous determination of the shear modulus and of the Poisson's number on samples of elastically isotropic and anisotropic materials |
Kong Boon Yeap, Malgorzata Kopycinska-Mueller, Martin Gall |
2018-12-11 |
| 10153062 |
Illumination and imaging device for high-resolution X-ray microscopy with high photon energy |
Martin Gall, Reiner Dietsch, Sven Niese |
2018-12-11 |
| 9117771 |
Insulation material for integrated circuits and use of said integrated circuits |
Gotthart Seifert, Helmut Hermann, Konstyantyn Zagorodniy |
2015-08-25 |
| 8056402 |
Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques |
Michael Hecker, Piotr Grabiec, Pawel Janus, Teodor Gotszalk |
2011-11-15 |
| 8039395 |
Technique for forming embedded metal lines having increased resistance against stress-induced material transport |
Moritz Andreas Meyer, Hans-Juergen Engelmann, Peter Huebler |
2011-10-18 |
| 7441446 |
Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing |
Dmytro Chumakov, Holm Geisler |
2008-10-28 |
| 7311008 |
Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure |
Eckhard Langer |
2007-12-25 |
| 7183629 |
Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal line |
Hans-Juergen Engelmann, Peter Huebler |
2007-02-27 |
| 6953755 |
Technique for monitoring the state of metal lines in microstructures |
Moritz Andreas Meyer, Eckhard Langer |
2005-10-11 |
| 6894390 |
Soft error resistant semiconductor device |
Gisela Schammler, Mathias Bottcher, Frank Kuechenmeister, Daniel Gehre |
2005-05-17 |
| 6303399 |
Method of sample preparation for electron microscopy |
Hans-Juergen Engelmann, Beate Volkmann |
2001-10-16 |
