Ehrenfried Zschech — 12 Patents at AMD

Ehrenfried Zschech has been granted 12 US patents while listed as an inventor at AMD. The first was granted in 2001 and the most recent in February 2022. Ehrenfried Zschech ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Ehrenfried Zschech in Radebeul, DE.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11243151	Device for carrying out bending tests on panel-shaped or beam shaped samples	Christoph Sander, Martin Gall, Frank Macher, Andre Clausner	2022-02-08
10151645	Arrangement and method for the synchronous determination of the shear modulus and of the Poisson's number on samples of elastically isotropic and anisotropic materials	Kong Boon Yeap, Malgorzata Kopycinska-Mueller, Martin Gall	2018-12-11
10153062	Illumination and imaging device for high-resolution X-ray microscopy with high photon energy	Martin Gall, Reiner Dietsch, Sven Niese	2018-12-11
9117771	Insulation material for integrated circuits and use of said integrated circuits	Gotthart Seifert, Helmut Hermann, Konstyantyn Zagorodniy	2015-08-25
8056402	Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques	Michael Hecker, Piotr Grabiec, Pawel Janus, Teodor Gotszalk	2011-11-15	$6,438,000
8039395	Technique for forming embedded metal lines having increased resistance against stress-induced material transport	Moritz Andreas Meyer, Hans-Juergen Engelmann, Peter Huebler	2011-10-18	$1,986,000
7441446	Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing	Dmytro Chumakov, Holm Geisler	2008-10-28	$5,544,000
7311008	Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure	Eckhard Langer	2007-12-25
7183629	Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal line	Hans-Juergen Engelmann, Peter Huebler	2007-02-27	$9,460,000
6953755	Technique for monitoring the state of metal lines in microstructures	Moritz Andreas Meyer, Eckhard Langer	2005-10-11	$12,751,000
6894390	Soft error resistant semiconductor device	Gisela Schammler, Mathias Bottcher, Frank Kuechenmeister, Daniel Gehre	2005-05-17	$3,810,000
6303399	Method of sample preparation for electron microscopy	Hans-Juergen Engelmann, Beate Volkmann	2001-10-16	$3,616,000

Ehrenfried Zschech — 12 Patents

Issued Patents All Time

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