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Home › Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques

Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques

US Patent 8056402 · Granted Nov 15, 2011

Estimated economic value: $6,438,000 ⓘ

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