Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8056402 | Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques | Michael Hecker, Ehrenfried Zschech, Piotr Grabiec, Teodor Gotszalk | 2011-11-15 |