DS

Dzmitry Sanko

AT Align Technology: 10 patents #123 of 483Top 30%
KL Kla-Tencor: 6 patents #245 of 1,394Top 20%
KL Kla: 2 patents #202 of 758Top 30%
Overall (All Time): #247,059 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12347567 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2025-07-01
11972873 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2024-04-30
11530913 Methods and systems for determining quality of semiconductor measurements Min-Yeong Moon, Stilian Ivanov Pandev 2022-12-20
11520321 Measurement recipe optimization based on probabilistic domain knowledge and physical realization Stilian Ivanov Pandev, Wei Lu 2022-12-06
11417432 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2022-08-16
11232867 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2022-01-25
11024431 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2021-06-01
10896761 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2021-01-19
10758321 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2020-09-01
10490462 Metrology systems and methods for process control Stilian Ivanov Pandev, Andrei V. Shchegrov 2019-11-26
10345095 Model based measurement systems with improved electromagnetic solver performance Stilian Ivanov Pandev, Leonid Poslavsky, Andrei V. Shchegrov 2019-07-09
10295342 System, method and computer program product for calibration of metrology tools Stilian Ivanov Pandev 2019-05-21
10215559 Metrology of multiple patterning processes Stilian Ivanov Pandev, Alexander Kuznetsov 2019-02-26
10216096 Process-sensitive metrology systems and methods Myungjun Lee, Mark D. Smith, Sanjay Kapasi, Stilian Ivanov Pandev, Pradeep Subrahmanyan +1 more 2019-02-26
10210606 Signal response metrology for image based and scatterometry overlay measurements Stilian Ivanov Pandev, Wei Lu, Siddharth Srivastava 2019-02-19
9566132 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2017-02-14
8545221 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2013-10-01
8092215 Smile designer Michelle Stone-Collonge, Eric Kuo, Rick M. Matty, Fabio Pettinati, Thomas Maurer 2012-01-10