| 11854882 |
Subtractive plug and tab patterning with photobuckets for back end of line (BEOL) spacer-based interconnects |
Kevin Lin, Robert L. Bristol |
2023-12-26 |
| 11854787 |
Advanced lithography and self-assembled devices |
Robert L. Bristol, Kevin Lin, Florian Gstrein, James M. Blackwell, Marie Krysak +6 more |
2023-12-26 |
| 11837542 |
Interconnects having a portion without a liner material and related structures, devices, and methods |
Manish Chandhok, Tristan A. Tronic |
2023-12-05 |
| 11837644 |
Contact over active gate structures with metal oxide-caped contacts to inhibit shorting |
Rami Hourani, Richard Vreeland, Giselle Elbaz, Manish Chandhok, Gurpreet Singh +4 more |
2023-12-05 |
| 11764263 |
Gate-all-around integrated circuit structures having depopulated channel structures using multiple bottom-up oxidation approaches |
Ehren Mannebach, Anh Phan, Aaron D. Lilak, Willy Rachmady, Gilbert Dewey +3 more |
2023-09-19 |
| 11721580 |
1D vertical edge blocking (VEB) via and plug |
Leonard P. GULER, Michael K. Harper, Suzanne S. Rich, Charles H. Wallace, Curtis W. Ward +4 more |
2023-08-08 |
| 11610810 |
Maskless air gap enabled by a single damascene process |
Miriam Reshotko, Nafees Kabir |
2023-03-21 |
| 11605623 |
Materials and layout design options for DSA on transition regions over active die |
Gurpreet Singh, Eungnak Han, Paul A. Nyhus, Florian Gstrein |
2023-03-14 |
| 11569231 |
Non-planar transistors with channel regions having varying widths |
Stephen D. Snyder, Leonard P. GULER, Michael K. Harper, Sam Sivakumar, Urusa Alaan +2 more |
2023-01-31 |