| 11442367 |
Optimizing a sequence of processes for manufacturing of product units |
Jochem Sebastiaan Wildenberg, Marinus Jochemsen, Erik Weber Jensen, Erik Johannes Maria Wallerbos, Cornelis Johannes Rijnierse +2 more |
2022-09-13 |
| 11435673 |
Method of determining a set of metrology points on a substrate, associated apparatus and computer program |
Kevin VAN DE RUIT, Jochem Sebastiaan Wildenberg |
2022-09-06 |
| 11378891 |
Method for determining contribution to a fingerprint |
Davit Harutyunyan, Fei Jia, Frank Staals, Fuming Wang, Hugo Thomas Looijestijn +8 more |
2022-07-05 |
| 11372338 |
Method for evaluating control strategies in a semiconductor manufacturing process |
Ivo Matteo Leonardus Weijden, Jeroen VAN DONGEN, Cornelis Johannes Henricus LAMBREGTS, Theo Wilhelmus Maria THIJSSEN, Ruud Rudolphus Johannes Catharinus De Wit +5 more |
2022-06-28 |
| 11327406 |
Estimating a parameter of a substrate |
Svetla Petrova Matova, Jochem Sebastiaan Wildenberg, Luc Roumen |
2022-05-10 |
| 11300887 |
Method to change an etch parameter |
Richard Johannes Franciscus Van Haren, Victor Emanuel Calado, Leon Paul VAN DIJK, Everhardus Cornelis Mos, Jochem Sebastiaan Wildenberg +4 more |
2022-04-12 |