Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11327406 | Estimating a parameter of a substrate | Jochem Sebastiaan Wildenberg, Roy Werkman, Luc Roumen | 2022-05-10 |
| 11294289 | Selecting a set of locations associated with a measurement or feature on a substrate | Pierluigi FRISCO, Jochem Sebastiaan Wildenberg | 2022-04-05 |