Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11448973 | Computational metrology based correction and control | Manouk RIJPSTRA, Wim Tjibbo Tel, Sarathi ROY, Cédric Désiré Grouwstra, Chi-Fei NIEN +3 more | 2022-09-20 |
| 11372338 | Method for evaluating control strategies in a semiconductor manufacturing process | Ivo Matteo Leonardus Weijden, Jeroen VAN DONGEN, Theo Wilhelmus Maria THIJSSEN, Ruud Rudolphus Johannes Catharinus De Wit, Hans Marinus Struijs +5 more | 2022-06-28 |