Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11520238 | Optimizing an apparatus for multi-stage processing of product units | Jelle Nije, Alexander Ypma, Dimitra GKOROU, Georgios TSIROGIANNIS, Robert Jan Van Wijk +3 more | 2022-12-06 |
| 11448973 | Computational metrology based correction and control | Manouk RIJPSTRA, Cornelis Johannes Henricus LAMBREGTS, Wim Tjibbo Tel, Cédric Désiré Grouwstra, Chi-Fei NIEN +3 more | 2022-09-20 |
| 11281110 | Methods using fingerprint and evolution analysis | Jeroen VAN DONGEN, Wim Tjibbo Tel, Yichen Zhang, Andrea Cavalli, Bart Laurens Sjenitzer +1 more | 2022-03-22 |
| 11243470 | Method and apparatus for deriving corrections, method and apparatus for determining a property of a structure, device manufacturing method | Nitish Kumar, Adrianus Johannes Hendrikus Schellekens, Sietse Thijmen Van Der Post, Ferry Zijp, Willem Coene +2 more | 2022-02-08 |