Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11435673 | Method of determining a set of metrology points on a substrate, associated apparatus and computer program | Roy Werkman, Jochem Sebastiaan Wildenberg | 2022-09-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11435673 | Method of determining a set of metrology points on a substrate, associated apparatus and computer program | Roy Werkman, Jochem Sebastiaan Wildenberg | 2022-09-06 |