Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10769761 | Generating high resolution images from low resolution images for semiconductor applications | Saurabh Sharma, Amitoz Singh Dandiana, Chao Fang, Amir Azordegan, Brian Duffy | 2020-09-08 |
| 10733744 | Learning based approach for aligning images acquired with different modalities | Thanh Huy Ha, Scott A. Young | 2020-08-04 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2020-03-31 |
| 10607119 | Unified neural network for defect detection and classification | Li He, Sankar Venkataraman, Huajun Ying, Hedong Yang | 2020-03-31 |
| 10533954 | Apparatus and methods for combined brightfield, darkfield, and photothermal inspection | Lena Nicolaides, Alex Salnik, Scott A. Young | 2020-01-14 |