Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2020-03-31 |
| 10599944 | Visual feedback for inspection algorithms and filters | Hucheng Lee, Lisheng Gao | 2020-03-24 |
| 10600177 | Nuisance reduction using location-based attributes | Bjorn Brauer, Lisheng Gao | 2020-03-24 |