Issued Patents 2020
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818005 | Previous layer nuisance reduction through oblique illumination | Jingshan Zhong, Lisheng Gao | 2020-10-27 |
| 10801968 | Algorithm selector based on image frames | — | 2020-10-13 |
| 10713534 | Training a learning based defect classifier | — | 2020-07-14 |
| 10698325 | Performance monitoring of design-based alignment | — | 2020-06-30 |
| 10648925 | Repeater defect detection | Eugene Shifrin, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran, Lisheng Gao | 2020-05-12 |
| 10620135 | Identifying a source of nuisance defects on a wafer | — | 2020-04-14 |
| 10600177 | Nuisance reduction using location-based attributes | Junqing Huang, Lisheng Gao | 2020-03-24 |
| 10600175 | Dynamic care areas for defect detection | Benjamin Murray, Shishir Suman, Lisheng Gao | 2020-03-24 |
| 10557802 | Capture of repeater defects on a semiconductor wafer | Hucheng Lee | 2020-02-11 |
| 10535131 | Systems and methods for region-adaptive defect detection | Christopher Maher, Vijayakumar Ramachandran, Laurent Karsenti, Eliezer Rosengaus, John R. Jordan +1 more | 2020-01-14 |