Issued Patents 2020
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818005 | Previous layer nuisance reduction through oblique illumination | Jingshan Zhong, Bjorn Brauer | 2020-10-27 |
| 10783673 | Method and apparatus for generating heatmap | Bing Ni | 2020-09-22 |
| 10648924 | Generating high resolution images from low resolution images for semiconductor applications | Jing Zhang, Grace Hsiu-Ling Chen, Kris Bhaskar, Keith Wells, Nan BAI +1 more | 2020-05-12 |
| 10648925 | Repeater defect detection | Eugene Shifrin, Bjorn Brauer, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran | 2020-05-12 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Junqing Huang +2 more | 2020-03-31 |
| 10599944 | Visual feedback for inspection algorithms and filters | Hucheng Lee, Junqing Huang | 2020-03-24 |
| 10600175 | Dynamic care areas for defect detection | Bjorn Brauer, Benjamin Murray, Shishir Suman | 2020-03-24 |
| 10600177 | Nuisance reduction using location-based attributes | Bjorn Brauer, Junqing Huang | 2020-03-24 |