Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10713769 | Active learning for defect classifier training | Jing Zhang, Yujie Dong, Brian Duffy, Richard Wallingford, Michael Daino | 2020-07-14 |
| 10648924 | Generating high resolution images from low resolution images for semiconductor applications | Jing Zhang, Grace Hsiu-Ling Chen, Keith Wells, Nan BAI, Ping Gu +1 more | 2020-05-12 |
| 10599951 | Training a neural network for defect detection in low resolution images | Laurent Karsenti, Brad Ries, Lena Nicolaides, Richard (Seng Wee) Yeoh, Stephen Hiebert | 2020-03-24 |