Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10599951 | Training a neural network for defect detection in low resolution images | Kris Bhaskar, Laurent Karsenti, Brad Ries, Richard (Seng Wee) Yeoh, Stephen Hiebert | 2020-03-24 |
| 10563973 | All surface film metrology system | Shifang Li, Paul Horn, Richard Graetz | 2020-02-18 |
| 10533954 | Apparatus and methods for combined brightfield, darkfield, and photothermal inspection | Mohan Mahadevan, Alex Salnik, Scott A. Young | 2020-01-14 |