Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10713769 | Active learning for defect classifier training | Jing Zhang, Yujie Dong, Brian Duffy, Michael Daino, Kris Bhaskar | 2020-07-14 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2020-03-31 |