Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605744 | Systems and methods for detecting defects on a wafer | Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2020-03-31 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605744 | Systems and methods for detecting defects on a wafer | Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2020-03-31 |