Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10697900 | Correlating SEM and optical images for wafer noise nuisance identification | Qiang Zhang | 2020-06-30 |
| 10648924 | Generating high resolution images from low resolution images for semiconductor applications | Jing Zhang, Kris Bhaskar, Keith Wells, Nan BAI, Ping Gu +1 more | 2020-05-12 |
| 10643819 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Doug K. Masnaghetti, Gabor Toth, David Trease, Rohit Bothra, Rainer Knippelmeyer | 2020-05-05 |
| 10545099 | Ultra-high sensitivity hybrid inspection with full wafer coverage capability | Lawrence P. Muray | 2020-01-28 |
| 10527568 | Counting particles using an electrical differential counter | Nicholas Watkins, Rashid Bashir, William Rodriguez, Xuanhong Cheng, Mehmet Toner +1 more | 2020-01-07 |