Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861671 | Method and system for focus adjustment of a multi-beam scanning electron microscopy system | Richard R. Simmons, Scott A. Young, Mark A. McCord, Rainer Knippelmeyer | 2020-12-08 |
| 10643819 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Gabor Toth, David Trease, Rohit Bothra, Grace Hsiu-Ling Chen, Rainer Knippelmeyer | 2020-05-05 |