Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861671 | Method and system for focus adjustment of a multi-beam scanning electron microscopy system | Doug K. Masnaghetti, Richard R. Simmons, Scott A. Young, Mark A. McCord | 2020-12-08 |
| 10643819 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Doug K. Masnaghetti, Gabor Toth, David Trease, Rohit Bothra, Grace Hsiu-Ling Chen | 2020-05-05 |
| 10622184 | Objective lens arrangement usable in particle-optical systems | Stefan Schubert | 2020-04-14 |
| 10541112 | Charged particle beam system and method of operating the same | Stefan Schubert, Thomas Kemen | 2020-01-21 |