RK

Rainer Knippelmeyer

Applied Materials: 2 patents #329 of 1,256Top 30%
CG Carl Zeiss Microscopy Gmbh: 2 patents #14 of 93Top 20%
KL Kla: 1 patents #6 of 106Top 6%
KL Kla-Tencor: 1 patents #130 of 345Top 40%
Overall (2020): #46,356 of 565,922Top 9%
4
Patents 2020

Issued Patents 2020

Patent #TitleCo-InventorsDate
10861671 Method and system for focus adjustment of a multi-beam scanning electron microscopy system Doug K. Masnaghetti, Richard R. Simmons, Scott A. Young, Mark A. McCord 2020-12-08
10643819 Method and system for charged particle microscopy with improved image beam stabilization and interrogation Doug K. Masnaghetti, Gabor Toth, David Trease, Rohit Bothra, Grace Hsiu-Ling Chen 2020-05-05
10622184 Objective lens arrangement usable in particle-optical systems Stefan Schubert 2020-04-14
10541112 Charged particle beam system and method of operating the same Stefan Schubert, Thomas Kemen 2020-01-21