Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10790114 | Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages | Ichiro Honjo, Christopher Sears, Hedong Yang, Jianwei Wang, Huina Xu | 2020-09-29 |
| 10733744 | Learning based approach for aligning images acquired with different modalities | Scott A. Young, Mohan Mahadevan | 2020-08-04 |
| 10670535 | Automated pattern fidelity measurement plan generation | Brian Duffy, Ajay Gupta | 2020-06-02 |