Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10790114 | Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages | Ichiro Honjo, Christopher Sears, Hedong Yang, Thanh Huy Ha, Jianwei Wang | 2020-09-29 |