Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10790114 | Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages | Ichiro Honjo, Christopher Sears, Thanh Huy Ha, Jianwei Wang, Huina Xu | 2020-09-29 |
| 10607119 | Unified neural network for defect detection and classification | Li He, Mohan Mahadevan, Sankar Venkataraman, Huajun Ying | 2020-03-31 |