Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10789703 | Semi-supervised anomaly detection in scanning electron microscope images | Shaoyu Lu, Sankar Venkataraman | 2020-09-29 |
| 10607119 | Unified neural network for defect detection and classification | Mohan Mahadevan, Sankar Venkataraman, Huajun Ying, Hedong Yang | 2020-03-31 |