Issued Patents 2019
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10483081 | Self directed metrology and pattern classification | Ajay Gupta, Jan Lauber | 2019-11-19 |
| 10456984 | Adaptive material deposition for additive manufacturing | Wojciech Matusik, Javier Ramos, Kiril Vidimce | 2019-10-29 |
| 10359371 | Determining one or more characteristics of a pattern of interest on a specimen | Brian Duffy, Ashok Kulkarni, Michael Lennek | 2019-07-23 |
| 10262831 | Method and system for weak pattern quantification | Andrew Cross | 2019-04-16 |
| 10262408 | System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer | Moshe E. Preil, Andrew Cross | 2019-04-16 |
| 10223492 | Based device risk assessment | Youseung Jin, Sungchan Cho, Barry Saville | 2019-03-05 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Ellis Chang, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2019-01-29 |
| 10181185 | Image based specimen process control | Lisheng Gao, Ashok Kulkarni, Saibal Banerjee, Ping Gu, Songnian Rong +1 more | 2019-01-15 |