Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10262408 | System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer | Allen Park, Moshe E. Preil | 2019-04-16 |
| 10262831 | Method and system for weak pattern quantification | Allen Park | 2019-04-16 |