Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474042 | Stochastically-aware metrology and fabrication | John Biafore | 2019-11-12 |
| 10262408 | System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer | Allen Park, Andrew Cross | 2019-04-16 |