Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10503078 | Criticality analysis augmented process window qualification sampling | Jagdish Chandra Saraswatula, Saibal Banerjee | 2019-12-10 |
| 10359371 | Determining one or more characteristics of a pattern of interest on a specimen | Brian Duffy, Michael Lennek, Allen Park | 2019-07-23 |
| 10181185 | Image based specimen process control | Allen Park, Lisheng Gao, Saibal Banerjee, Ping Gu, Songnian Rong +1 more | 2019-01-15 |