Issued Patents 2019
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10514685 | Automatic recipe stability monitoring and reporting | Hucheng Lee, Govindarajan Thattaisundaram | 2019-12-24 |
| 10410338 | Method and system for correlating optical images with scanning electron microscopy images | Hucheng Lee, Jan Lauber, Yong Zhang | 2019-09-10 |
| 10395358 | High sensitivity repeater defect detection | Bjorn Brauer, Eugene Shifrin, Ashok Mathew, Chetana Bhaskar, Santosh Bhattacharyya +2 more | 2019-08-27 |
| 10393671 | Intra-die defect detection | Govindarajan Thattaisundaram, Hucheng Lee | 2019-08-27 |
| 10395359 | Adaptive local threshold and color filtering | Junqing Huang, Hucheng Lee, Kenong Wu | 2019-08-27 |
| 10339262 | System and method for defining care areas in repeating structures of design data | Junqing Huang, Soren Konecky, Hucheng Lee, Kenong Wu | 2019-07-02 |
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Tao-Yi Fu, Steve R. Lange, Xuguang Jiang, Ping Gu, Sylvain Muckenhirn | 2019-06-18 |
| 10181185 | Image based specimen process control | Allen Park, Ashok Kulkarni, Saibal Banerjee, Ping Gu, Songnian Rong +1 more | 2019-01-15 |