Issued Patents 2019
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504213 | Wafer noise reduction by image subtraction across layers | — | 2019-12-10 |
| 10402688 | Data augmentation for convolutional neural network-based defect inspection | Vijay Ramachandran, Richard Wallingford, Scott A. Young | 2019-09-03 |
| 10395358 | High sensitivity repeater defect detection | Eugene Shifrin, Ashok Mathew, Chetana Bhaskar, Lisheng Gao, Santosh Bhattacharyya +2 more | 2019-08-27 |
| 10360671 | Tool health monitoring and matching | Ravichander Rao, Gary Taan, Andreas Russ, Roger B. Davis, Bryant Mantiply +2 more | 2019-07-23 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Scott A. Young, Mark J. Roulo, Jing Zhang, Laurent Karsenti +1 more | 2019-07-23 |
| 10192302 | Combined patch and design-based defect detection | Santosh Bhattacharyya | 2019-01-29 |
| 10186028 | Defect signal to noise enhancement by reducing die to die process noise | James A. Smith | 2019-01-22 |