Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10416087 | Systems and methods for defect detection using image reconstruction | Jing Zhang, Jeremy Nesbitt, Grace Hsiu-Ling Chen | 2019-09-17 |
| 10402688 | Data augmentation for convolutional neural network-based defect inspection | Bjorn Brauer, Vijay Ramachandran, Scott A. Young | 2019-09-03 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Songnian Rong, Chetana Bhaskar | 2019-01-29 |