Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429319 | Inspection system including parallel imaging paths with multiple and selectable spectral bands | Shiow-Hwei Hwang, Amir Bar, Daniel L. Cavan | 2019-10-01 |
| 10416087 | Systems and methods for defect detection using image reconstruction | Jing Zhang, Jeremy Nesbitt, Richard Wallingford | 2019-09-17 |
| 10215713 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Pavel Kolchin, Mikhail Haurylau, Junwei Wei, Dan Kapp, Robert M. Danen | 2019-02-26 |