Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317347 | Determining information for defects on wafers | Stefano Palomba, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2019-06-11 |
| 10215713 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Mikhail Haurylau, Junwei Wei, Dan Kapp, Robert M. Danen, Grace Hsiu-Ling Chen | 2019-02-26 |